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研究與發展

晶圓級探針卡技術 2022/07/20

晶圓級探針卡技術
簡介 Introductions

開發 3D 陶瓷電路板及微機電探針,取代環氧樹酯探針,探針精微化容易,提高一次測試晶粒數 (16 → 30 或32)。結合微機電探針製程可發展模組化探針組裝技術,可將探針組裝由單根 / 次大幅提升百根 / 次以上,大幅減少組裝人力與成本。

ITRI developed 3D ceramic circuit boards and MEMS probes to replace epoxy resin ring probes. The probes could reach fine pitch and increase the testing grains (16 → 30 or 32) at the same time. Combined with the MEMS probe process, ITRI developed the modular probe assembly technology, which can massively increase the probe assembly effiency from a single probe per time to more than one hundred probes per time, greatly reducing assembly labor and costs. 

特色與創新 Characters and Innovations

  • 結合雷射圖案化與高選擇性金屬化技術,於 3D 陶瓷表面製作 3D 金屬線路,具有低成本與高彈性優勢。
  • 發展高硬度三元合金金屬化技術 ( 硬度 ≥ 800HV),進行微機電探針製作。
  • 開發高精度積體化 3D 探針接合技術與雙面對準接合設備,進行模組化百根探針以上接合。
  • Combining laser patterning and high-selective metallization technology, 3D metal circuits can be fabricated on the 3D ceramic surface, which has the advantages of low cost and high customization ability.
  • Develop high-hardness ternary alloy metallization technology (hardness ≥ 800 HV), and applied to fabricating MEMS probes.
  • Develop high-precision integrated 3D probe bonding technology and double-sided alignment bonding equipment to perform modular bonding of more than 100 probes.

應用與效益 Applications and Benefits

  • 水平式探針卡、微機電探針、3D 陶瓷電路板
  • Horizontal probe card, MEMS probe, 3D ceramic circuit board.

聯絡 contact

  • 黃萌祺 Meng-Chi Huang
  • E-mail: ach@itri.org.tw
  • TEL:886-3-5915841
  • FAX:886-3-5820043

更多資訊

三階MEMS晶片
三階MEMS 探針